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The Fluence Conversion Coefficients method : applications to radiological characterization with the FLUKA and PHITS codes. / Bozzato, D ; Froeschl, R (ed.)
One of the key aspects of radiation protection is the radiological characterization of components that have been exposed to a radiation environment [...]

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Semi-formal Reformulation of Requirements for Formal Property Verification / Ceesay-Seitz, Katharina (CERN) ; Boukabache, Hamza (CERN) ; Perrin, Daniel (CERN)
Ambiguously specified requirements can be a source of risk for safety-critical electronic designs. Requirement specifications in natural language are subject to misinterpretation. [...]
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In : Design and Verification Conference in Europe, Munich, 29 - 30 Oct 2019, pp.7.1

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