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CERN Accelerating science

Report number arXiv:1310.2620
Title Effect of Temperature and Charged Particle Fluence on the Resistivity of Polycrystalline CVD Diamond Sensors
Author(s) Wang, Rui (New Mexico U.) ; Hoeferkamp, Martin (New Mexico U.) ; Seidel, Sally (New Mexico U.)
Imprint 09 Oct 2013. - 5 p.
Note Comments: 13 pages, 8 figures
In: Nucl. Instrum. Methods Phys. Res., A 735 (2014) 610-614
DOI 10.1016/j.nima.2013.10.007
Subject category hep-ex ; Particle Physics - Experiment ; physics.ins-det ; Detectors and Experimental Techniques
Accelerator/Facility, Experiment RD42
Abstract The resistivity of polycrystalline chemical vapor deposition diamond sensors is studied in samples exposed to fluences relevant to the environment of the High Luminosity Large Hadron Collider. We measure the leakage current for a range of bias voltages on samples irradiated with 800 MeV protons up to 1.6\times 10^{16} p/cm^2. The proton beam at LANSCE, Los Alamos National Laboratory, was applied to irradiate the samples. The devices' resistivity is extracted for temperatures in the -10^\circC to +20^\circC range.
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Corresponding record in: Inspire

 Datensatz erzeugt am 2013-10-11, letzte Änderung am 2018-10-09

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